A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2013; you can also visit the original URL.
The file type is
Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)
We describe a Built-In Self-Test (BIST) approach that was developed for the programmable Input/Output (I/O) buffers in Field Programmable Gate Arrays (FPGAs). The approach is unique when compared with previous work because the I/O buffers are tested separately from the other programmable logic in the I/O cells. The capabilities and limitations of system-level use of this I/O buffer BIST are discussed in conjunction with experimental results from the implementation and actual use of the approachdoi:10.1109/secon.2010.5453818 fatcat:kmpy5kriuffwtou45ezypfr3xy