On system-level use of BIST for programmable Input/Output buffers in FPGAs

Bradley F. Dutton, Lee W. Lerner, Sudheer Vemula, Charles E. Stroud
2010 Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)  
We describe a Built-In Self-Test (BIST) approach that was developed for the programmable Input/Output (I/O) buffers in Field Programmable Gate Arrays (FPGAs). The approach is unique when compared with previous work because the I/O buffers are tested separately from the other programmable logic in the I/O cells. The capabilities and limitations of system-level use of this I/O buffer BIST are discussed in conjunction with experimental results from the implementation and actual use of the approach
more » ... use of the approach in systems. I.
doi:10.1109/secon.2010.5453818 fatcat:kmpy5kriuffwtou45ezypfr3xy