Enhanced controllability for IDDQ test sets using partial scan

Tapan J. Chakraborty, Sudipta Bhawmik, Robert Bencivenga, C. J. Lin
1991 Proceedings of the 28th conference on ACM/IEEE design automation conference - DAC '91  
It has been shown recently that the advantages of IDDQ testing for stuck-at faults are reduced test set size, increased fault coverage and faster test generation time. Also untestability due to poor observability is eliminated. However, untestability due to poor controllability still remains and affects the IDDQ test results. In thii paper, we introduce the concept of partial scan in test generation process. This results in increased controllability and hence reducing untestable faults in IDDQ
more » ... ble faults in IDDQ test results. Moreover, resulting test sets are further reduced and overall test generation time is improved.
doi:10.1145/127601.127680 dblp:conf/dac/ChakrabortyBBL91 fatcat:dfg6e2wruvceva3k25wrg6px4a