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Soft-X-ray spectra of highly charged Os, Bi, Th, and U ions in an electron beam ion trap
2005
Canadian journal of physics (Print)
Systematic variation of the electron-beam energy in an electron-beam ion trap has been employed to produce soft-X-ray spectra of Os, Bi, Th, and U with highest charge states ranging up to Ni-like ions. Guided by relativistic atomic structure calculations, the strongest lines have been identified with ∆n=0 (n=4 to n =4) transitions in Rb-to Cu-like ions. The rather weak 4p-4d transitions are much less affected by QED contributions than the dominant 4s-4p transitions. Our wavelength measurements
doi:10.1139/p05-043
fatcat:ek7tw2qphbcitiynt5vykggttm