#AiMES2018_20181002_1400_Low-T-SiGe_Porret [post]

Clement Porret, Andriy Hikavyy, Juan Fernando Gomez Granados, Sylvain Baudot, Anurag Vohra, Bernardette Kunert, Bastien Douhard, Janusz Bogdanowicz, Marc Schaekers, David Kohen, Joe Margetis, John Tolle (+6 others)
2018 unpublished
As CMOS scaling proceeds with sub-10 nm nodes, new architectures and materials are implemented to continue increasing performances at constant footprint. Strained and stacked channels and 3D-integrated devices have for instance been introduced for this purpose. A common requirement for these new technologies is a strict limitation in thermal budgets to preserve the integrity of devices already present on the chips. We present our latest developments on low-temperature epitaxial growth
more » ... ranging from channel to source/drain applications for a variety of devices and describe options to address the upcoming challenges.
doi:10.1149/osf.io/3fvqn fatcat:5yrxqf6sofaajdlldchjm2f2b4