International comparison on SST and Epstein measurements in grain-oriented Fe-Si sheet steel

C. Appino, E. Ferrara, F. Fiorillo, L. Rocchino, C. Ragusa, J. Sievert, T. Belgrand, C. Wang, P. Denke, S. Siebert, Y. Norgren, K. Gramm (+11 others)
2015 International journal of applied electromagnetics and mechanics  
doi:10.3233/jae-151978 fatcat:65eaej77vrhcvnjeapreqjcbfq