Detecting Cracks in Semiconductor Solarcells from Eddy-Current Measurements [chapter]

Jeff C. Treece, Bishara F. Shamee
1989 Review of Progress in Quantitative Nondestructive Evaluation  
doi:10.1007/978-1-4613-0817-1_160 fatcat:j2albxp2jbfh7cd5rngybm3h6u