Growth and Structure of Crystalline Silica Sheet on Ru(0001)

D. Löffler, J. J. Uhlrich, M. Baron, B. Yang, X. Yu, L. Lichtenstein, L. Heinke, C. Büchner, M. Heyde, S. Shaikhutdinov, H.-J. Freund, R. Włodarczyk (+2 others)
2010 Physical Review Letters  
Thin SiO 2 films were grown on a Ru(0001) single crystal and studied by photoelectron spectroscopy, infrared spectroscopy and scanning probe microscopy. The experimental results in combination with density functional theory calculations provide compelling evidence for the formation of crystalline, double-layer sheet silica weakly bound to a metal substrate.
doi:10.1103/physrevlett.105.146104 pmid:21230849 fatcat:xk556f2nxbelnekd5kge6wmxcm