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The DFT and Test challenges faced, and the solutions applied, to the ARMl026EJ microprocessor core are described in this paper. New DFT techniques have been created to address the challenges of distributing a DFT core solution that will ultimately end up in many different environments. This core was instantiated into a test chip. The new DFT features were utilized successfully in the SOC. ITC INTERNATIONAL TEST CONFERENCE 0-7803-81 06-8/03 $1 7.00doi:10.1109/test.2003.1270907 dblp:conf/itc/McLaurinFS03 fatcat:eozgl25ki5dzjo4zqvuik774vi