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Synthesis of controllers for full testability of integrated datapath-controller pairs
1999
Proceedings of the conference on Design, automation and test in Europe - DATE '99
This work facilitates the testing of datapath-controller pairs in an integrated fashion, with datapath and controller tested together in a single test session. Such an approach requires less test overhead than an approach that isolates datapath and controller from each other during test. The ability to do an integrated test is especially important when testing core-based embedded systems. The key to the approach is a careful examination of the relationship between techniques for controller
doi:10.1145/307418.307505
fatcat:n5nfzhkg2zed5b44palbymdcou