This Small Delay Tracing Defect Testing detect small delay defects by creating internal signal races. The races are created by launching transitions along simultaneous two paths, a reference path and a test path. The arrival times of the transitions on a 'convergence' or common gate determine the result of the race. On the output of the convergence gate, a static hazard created by a small delay defect presence on the test path which is directed to the input of a scan-latch. A glitch detector is

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... added to the scan latch which records the presence or absence of the glitch.