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Security Problems of Scan Design and Accompanying Measures
2016
Journal of Electrical Engineering
The paper deals with the security problems of scan design and investigates currently proposed solutions. A solution based on data encryption to protect the data in scan chains is discussed and problems related to the block-based encoding are outlined. Next, security extension for IEEE Std. 1149.1 providing a locking mechanism is analysed. The mechanism prevents unauthorised users to interfere via test bus with the system normal operation. Possible attack scenario is considered and the
doi:10.1515/jee-2016-0027
fatcat:v6srsjy3rfcwtkrxgjii7bzmey