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Field-ion microscopy ͑FIM͒ is used to resolve the atomic structure and orientation of individual nanometersize Au clusters supported on sharp tips of W, Pt, and a Pt/Ir alloy. The FIM images from a single cluster illustrate that the technique is capable of providing atomically resolved images of supported nanometer-size clusters in an ultrahigh vacuum environment. By comparing computer simulations of a FIM image to experimental data, the atomic structure and orientation of the supported clusterdoi:10.1103/physrevb.58.15889 fatcat:4wowo5fibrhjnaucqynhkz4vfi