DRAM Characterization under Relaxed Refresh Period Considering System Level Effects within a Commodity Server

Lev Mukhanov, Konstantinos Tovletoglou, Dimitrios S. Nikolopoulos, Georgios Karakonstantis
2018 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)  
doi:10.1109/iolts.2018.8474184 dblp:conf/iolts/MukhanovTNK18 fatcat:zcruhoy64bdajdtizvxa3xgptu