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One important trend in today's microprocessor architectures is the increase in size of the processor caches. These caches also tend to be set associative. As technology scales, process variations are expected to increase the fault rates of the SRAM cells that compose such caches. As an important component of the processor, the parametric yield of SRAM cells is crucial to the overall performance and yield of the microchip. In this article, we propose a microarchitectural solution, called thedoi:10.1145/1543753.1543757 fatcat:qk2fxfrqyndlrfegez2mg7tsge