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Atomic column positions in images of scanning transmission electron microscopy (STEM) contain important information about material structure and properties, but the precision with which those columns can be located is often limited by noise in the measured intensities and by scan distortion. Several previous works (e.g. [1-3]) have used post-processing methods on a series of STEM images to obtain single high signal-to-noise ratio, reduced distortion images. Then, from those images, precisedoi:10.1017/s1431927617001507 fatcat:e5kg3g25jnf2bfv7oun74vaxrm