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Reliability of embedded processors is one of the major concerns in safety-critical applications. Reliability is particularly expressed within the cache memories which are the largest part of new system on chips. Cache memories are the most vulnerable parts of the embedded systems and can affect the reliability drastically especially in deep transistor scaling. Therefore, evaluating the cache vulnerability is crucial in design of a reliable system especially for safety-criticaldoi:10.36227/techrxiv.14730219 fatcat:vwi25yunn5d6nd4d2qewllyufa