A Concurrent Built-In Self-Test Architecture Based on a Self-Testing RAM

I. Voyiatzis, A. Paschalis, D. Gizopoulos, N. Kranitis, C. Halatsis
2005 IEEE Transactions on Reliability  
doi:10.1109/tr.2004.842091 fatcat:kvhgfdlxdjbvbjvxy67juqxtqu