A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2017; you can also visit the original URL.
The file type is application/pdf
.
Statistical Performance Modeling and Optimization
2006
Foundations and Trends® in Electronic Design Automation
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing processes have introduced unavoidable and significant uncertainty in circuit performance; hence ensuring manufacturability has been identified as one of the top priorities of today's IC design problems. In this paper, we review various statistical methodologies that have been recently developed to model, analyze, and optimize
doi:10.1561/1000000008
fatcat:wrfrfutwjbdx3lc4cp3fj6djay