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GaN-Based High-$Q$ Vertical-Cavity Light-Emitting Diodes
2007
IEEE Electron Device Letters
We report a fabrication and demonstration of a GaN-based high-Q vertical-cavity light-emitting diode (VCLED). The GaN VCLED is composed of a 25-pair high-reflectivity (98%) GaN/AlN distributed Bragg reflector (DBR), an eight-pair SiO 2 /Ta 2 O 5 dielectric DBR (99%), and a three-λ optical thickness InGaN/GaN active region. It shows a very narrow linewidth of 0.52 nm, corresponding to a cavity Q-value of 895 at a driving current of 10 mA and a dominant emission peak wavelength at 465.3 nm. In
doi:10.1109/led.2007.904906
fatcat:ilsvybyupnadxildacbzjiyupi