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Invariance-based on-line test for RTL controller-datapath circuits
Proceedings 18th IEEE VLSI Test Symposium
We present a low-cost on-line test methodology for RTL controller-datapath pairs, based on the notion of path invariance. The fundamental observation supporting the proposed methodology is that the transparency behavior inherent in RTL components renders rich sources of invariance in a design. Furthermore, the algorithmic controller-datapath interaction provides additional sources of invariance. judicious selection and combination of modular transparency, based on the algorithm implemented by
doi:10.1109/vtest.2000.843879
dblp:conf/vts/MakrisBO00
fatcat:xtcjiuwjwrhptlxfoizimqu4ae