X-ray pixel detector for crystallography

P. Delpierre, J.F. Berar, L. Blanquart, B. Caillot, J.C. Clemens, C. Mouget
2000 IEEE Nuclear Science Symposium. Conference Record (Cat. No.00CH37149)  
For X-rays diffraction experiments, the required dynamic range is a challenge. The signal ranges usually over more than six orders of magnitude. To meet this requirement and to reduce the readout time with respect to the commonly used CCD camera a dedicated hybrid pixel detector is under development. We have designed a new counting chip with pixel sizes of 330µm. The expected counting rate per pixel is 10 7 ph/s and a continuous readout with time stamping will allow a dynamic range for up to 4
more » ... 10 9 (16-bit counter in each pixel and 16-bit counter per pixel in the readout boards). This chip has been submitted for fabrication and it is under test. First results of this chip will be presented. As a first step a small detector (4x 1.6 cm 2 ) is being built, using a DELPHI (LEP/CERN) silicon array of diodes which have good efficiency for collecting X-ray between 5 and 25 keV. After the electrical tests, the performances of this X-ray detector will be measured in the ESRF-D2AM beam line (Grenoble, France), scheduled in next December. If this prototype performs as expected, a large array (25 x 25 cm 2 ) of such detectors could be built.
doi:10.1109/nssmic.2000.949003 fatcat:ldd25jnfvzeznczj7brnmegnye