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The Al- and Cu-doped ZnO nanostructured films in this study were deposited using a sputtering technique. Investigations based on X-ray diffraction, X-ray photoelectron spectroscopy, scanning electron microscopy, Hall effect measurements, and optical transmission spectroscopy was performed to analyze the structural, electrical, and optical characteristics of the prepared Al–ZnO and Cu–ZnO nanostructured films. The analyses show that doping results in enhanced conductivity as well as improveddoi:10.3390/cryst12020128 fatcat:upj33bxzubc6xnycnmqxczk55y