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This work investigates techniques for building fault-tolerant digital circuits at the nano-scale. It provides an overview of some nano-scale technology candidates that can be used in the next generation of digital circuit based on nanoelectronic logic fabrics. It focuses on fault tolerance of such circuits at both the circuit and the architecture level. A case study based on pass-transistor logic using wrap-gate nanowire devices is presented. Such circuits implement logic computing in the formdoi:10.11575/prism/26166 fatcat:eaqzsejvsbachi33kkdavespsi