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Degradation pathway models for photovoltaics module lifetime performance
2013
2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)
Previously published accelerated testing data from Underwriter Labs, featuring measurements taken on 18 identical photovoltaic (PV) modules exposed to two stress conditions, were used to develop an analytical methodology. The results provide insight into active degradation mechanisms and pathways present in PV modules under accelerated testing conditions as indicated by statistically significant relationships between variables. Observed experimental results coincide with a domain knowledge
doi:10.1109/pvsc.2013.6745130
fatcat:uboydtskbrabvpyj2jh5udua64