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Critical size for defects in nanostructured materials
2006
Journal of Applied Physics
This paper addresses some of the fundamental issues and critical advantages in reducing the grain size/ feature size to the nanoscale regime. We find that as the grain size or feature size is reduced, there is a critical size below which the defect content can be reduced virtually to zero. This critical size for most defects in solid state materials falls in the nanoscale regime. Thus, nanostructured materials offer a unique opportunity to realize the property of a perfect material. However,
doi:10.1063/1.2220472
fatcat:eagacorgebbxtcsvphxz2snjfy