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Formation of Aluminum Microsphere by Utilizing Atomic Migration
2017
IOSR Journal of Electrical and Electronics Engineering
A technique using the sudden change in the geometrical shape of metal line is considered for effective accumulation of atoms, and therefore fabrication of micro/nano materials utilizing electromigration. The experimental sample of Al metal line is formed on a TiN layer and covered with a SiO 2 passivation layer. Thereafter, the sample is placed on a ceramic heater under atmospheric conditions, and subjected to a constant direct current for fabricating micro/nano materials. Finally, microsphere
doi:10.9790/1676-1203016468
fatcat:qxsa3fykf5hctjac57koj3xtsq