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ElectroMagnetic (EM) waves have been recently pointed out as a medium for fault injection within Integrated Circuits (IC). Indeed, it has been experimentally demonstrated that an EM Pulse (EMP), produced with a high voltage pulse generator and an injector similar to that used to perform EM analyses, was susceptible to create faults exploitable from a cryptanalysis viewpoint. An analysis of the induced faults revealed that they originated from timing constraint violations. In this context, thisdoi:10.1007/s13389-016-0128-3 fatcat:zvut5j5pkrc6fkoh52dwhzqzpi