A scanning tunneling microscope control system with potentiometric capability

A.H. Bredekamp, J. Tapson
1999 1999 IEEE Africon. 5th Africon Conference in Africa (Cat. No.99CH36342)  
doi:10.1109/afrcon.1999.820754 fatcat:ebuzcforlvenzh3uaj6i74xhca