Os elementos na matéria [thesis]

Manfredo Harri Tabacniks
The elementary composition of materials is investigated with the use of Ion Beam Methods, a combination of elementary analytical techniques that employ monoenergetic ion beams in the range of 100 to 2000 keV/u. The analytical methods RBS (Rutherford Backscattering Spectrometry), PIXE (Particle Induced X Ray Emission) and ERDA (Elastic Recoil Detection Analysis) are reviewed. These are extremely sensitive, multielementary and non destructive analytical methods, capable of detecting all elements
more » ... cting all elements of the periodic table down to a detection limit of one atomic layer or 1 µg/g (1 ppm) mass ratio, with an absolute precision of about 3%. Starting with a phenomenological review on the interactions of swift ions in matter, the sopping power of ions is related to the phenomena which gives rise to the actual analytical methods. A brief formulation of the Rutherford Backscattering Spectrometry and the Forward Recoil Spectrometry is shown. This last one, is one of the few methods for the analysis of Hydrogen in thin films. The PIXE method is also formulated with special emphasis to the analysis of thick targets. Many applications using ion beam methods are described, pointing out the PIXE analysis of tree rings, a novel procedure for the PIXE analysis of thick targets and a research attempting to discriminate surface roughness from diffusion in RBS analysis. Future trends and challenges are presented in the final remarks, to build a roadmap into the future for the Laboratório de Análise de Materiais com Feixes Iônicos. vi Sumário
doi:10.11606/t.43.2014.tde-24012014-153254 fatcat:3t4i4cshyjhq5njc5xgb2cca5u