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Abstract. This paper treats Characteristic Mode Analyses of three-dimensional test objects in the context of EMC. Based on computed Characteristic Modes and mode-specific physical quantities, series expansions for HIRF- and DCI-induced surface currents are deduced. The contribution of single Characteristic Modes to surface currents at different test frequencies is analyzed. HIRF- and DCI-excitations are compared with regard to their surface current distributions in their resonance region determined by Characteristic Mode Analysis.doi:10.5194/ars-18-33-2020 fatcat:7indzzzwnfgnnhm3qv6274qxfm