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Universal threshold for femtosecond laser ablation with oblique illumination
Applied Physics Letters
We quantify the dependence of the single-shot ablation threshold on the angle of incidence and polarization of a femtosecond laser beam, for three dissimilar solid-state materials: a metal, a dielectric and a semiconductor. Using the constant, linear value of the index of refraction, we calculate the laser fluence transmitted through the air-material interface at the point of ablation threshold. We show that, in spite of the highly nonlinear ionization dynamics involved in the ablation process,doi:10.1063/1.4965850 fatcat:qnmhyp6imrbofgerat52bxbcgy