Characterization of aluminum oxide tunnel barriers by combining transport measurements and transmission electron microscopy imaging

T. Aref, A. Averin, S. van Dijken, A. Ferring, M. Koberidze, V. F. Maisi, H. Q. Nguyend, R. M. Nieminen, J. P. Pekola, L. D. Yao
2014 Journal of Applied Physics  
doi:10.1063/1.4893473 fatcat:zo3mcuxoqngzhb7ubr72o3llfu