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Deep Learning-Based Algorithm for Multi-Type Defects Detection in Solar Cells with Aerial EL Images for Photovoltaic Plants
2022
CMES - Computer Modeling in Engineering & Sciences
Defects detection with Electroluminescence (EL) image for photovoltaic (PV) module has become a standard test procedure during the process of production, installation, and operation of solar modules. There are some typical defects types, such as crack, finger interruption, that can be recognized with high accuracy. However, due to the complexity of EL images and the limitation of the dataset, it is hard to label all types of defects during the inspection process. The unknown or unlabeled create
doi:10.32604/cmes.2022.018313
fatcat:hlfllljjcfe2jnaxd4ua33tmny