Estimation of Defects Based on Defect Decay Model: ED^{3}M

S.W. Haider, J.W. Cangussu, K.M.L. Cooper, R. Dantu
2008 IEEE Transactions on Software Engineering  
An accurate prediction of the number of defects in a software product during system testing contributes not only to the management of the system testing process but also to the estimation of the product's required maintenance. Here, a new approach, called Estimation of Defects based on Defect Decay Model (ED 3 M) is presented that computes an estimate of the total number of defects in an ongoing testing process. ED 3 M is based on estimation theory. Unlike many existing approaches, the
more » ... aches, the technique presented here does not depend on historical data from previous projects or any assumptions about the requirements and/or testers' productivity. It is a completely automated approach that relies only on the data collected during an ongoing testing process. This is a key advantage of the ED 3 M approach as it makes it widely applicable in different testing environments. Here, the ED 3 M approach has been evaluated using five data sets from large industrial projects and two data sets from the literature. In addition, a performance analysis has been conducted using simulated data sets to explore its behavior using different models for the input data. The results are very promising; they indicate the ED 3 M approach provides accurate estimates with as fast or better convergence time in comparison to well-known alternative techniques, while only using defect data as the input.
doi:10.1109/tse.2008.23 fatcat:ttlpi3ugg5cttpihhtegmzyesi