Origin of background electron concentration in InxGa1−xN alloys

B. N. Pantha, H. Wang, N. Khan, J. Y. Lin, H. X. Jiang
2011 Physical Review B  
The origin of high background electron concentration (n) in In x Ga 1-x N alloys has been investigated. A shallow donor was identified as having an energy level (E D1 ) that decreases with x (E D1 =16 meV at x=0 and E D1 =0 eV at x ∼ 0.5) and that crossover the conduction band at x ∼ 0.5. This shallow donor is believed to be the most probable cause of high n in InGaN. This understanding is consistent with the fact that n increases sharply with an increase in x and becomes constant for x > 0.5.
more » ... stant for x > 0.5. A continuous reduction in n was obtained by increasing the V/III ratio during the epilayer growth, suggesting that nitrogen vacancy related impurities are a potential cause of the shallow donors and high background electron concentration in InGaN.
doi:10.1103/physrevb.84.075327 fatcat:3abgsdv6dvbnhoppuj23ypdy64