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Dependence of Al0.48In0.52As Schottky diode properties on molecular beam epitaxial growth temperature
1996
Applied Physics Letters
We have observed a degradation in the epitaxial layer quality of AlInAs when it is grown by molecular beam epitaxy at a substrate temperature of about 400°C compared to that for alloys grown at 300 and 500°C. The barrier height and ideality factor of Ti-and Au-AlInAs Schottky diodes also exhibit large spatial variations and dependence on growth temperatures. The observed phenomena can be explained by invoking a kinetic growth model or thermodynamic phase equilibria in the growing surface layer.
doi:10.1063/1.116466
fatcat:ag6owkzy7za7hbfji52qn3keqe