Dependence of Al0.48In0.52As Schottky diode properties on molecular beam epitaxial growth temperature

A. S. Brown, P. Bhattacharya, J. Singh, P. Zaman, S. Sen, F. Turco
1996 Applied Physics Letters  
We have observed a degradation in the epitaxial layer quality of AlInAs when it is grown by molecular beam epitaxy at a substrate temperature of about 400°C compared to that for alloys grown at 300 and 500°C. The barrier height and ideality factor of Ti-and Au-AlInAs Schottky diodes also exhibit large spatial variations and dependence on growth temperatures. The observed phenomena can be explained by invoking a kinetic growth model or thermodynamic phase equilibria in the growing surface layer.
doi:10.1063/1.116466 fatcat:ag6owkzy7za7hbfji52qn3keqe