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Local Measurements of Diffusion Length and Chemical Character of Metal Clusters in Multicrystalline Silicon
Solid State Phenomena
We present a comprehensive description of synchrotron-based analytical microprobe techniques used to locally measure the diffusion length and chemical character of metal clusters in multicrystalline silicon (mc-Si) solar cell material. The techniques discussed are (a) X-ray fluorescence microscopy, capable of determining the spatial distribution, elemental nature, size, morphology, and depth of metal-rich particles as small as 30 nm in diameter; (b) X-ray absorption microspectroscopy, capabledoi:10.4028/www.scientific.net/ssp.108-109.577 fatcat:ofxb4jepunb6vetf4sa56nym7q