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Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks
2020
IEEE Transactions on Neural Networks and Learning Systems
In this article, a novel approach for training deep neural networks using Bayesian techniques is presented. The Bayesian methodology allows for an easy evaluation of model uncertainty and, additionally, is robust to overfitting. These are commonly the two main problems classical, i.e., non-Bayesian architectures have to struggle with. The proposed approach applies variational inference in order to approximate the intractable posterior distribution. In particular, the variational distribution is
doi:10.1109/tnnls.2020.2980004
pmid:32310784
fatcat:iru73wow3bfqvocdpbh4qufy4a