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Surface analysis of dispersive complex-particles by low-energy electron emission measurements
低エネルギー光電子放射による分散型複合材料の表面分析
1988
Hyomen Kagaku
低エネルギー光電子放射による分散型複合材料の表面分析
A quantitative analysis method with a low-energy photo-electron counter in the atmosphere was developed for pigment on surface of polymer particles, and the detectable depth of this method for organic compounds was experimentally estimated using LB-film. First, we investigated the changes of photo-electron emission property (i. e. ionization energy and line inclination of emission yield vs. irradiation energy) of aluminum substrate, when the thickness of LB-film on it increased according to the
doi:10.1380/jsssj.9.608
fatcat:moxb5tkgd5ev5hlmropkk7xdey