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Subtle spatial structures are often reflected on higher-order correlations. Fluctuation microscopy is a good method for detecting such spatial structures in disordered materials, because the method detects the contribution of the fourth-order density distribution function. We propose an improvement for fluctuation microscopy that increases its sensitivity to subtle spatial structures by enhancing the contributions of both the third-and the fourth-order density cumulant functions to thedoi:10.1103/physrevb.60.191 fatcat:b5zq7fczynasfeiforpte5ket4