A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2018; you can also visit the original URL.
The file type is
Surface Characterization and Testing II
A recently-developed long-trace surface profiling instrument (LTP) is now in operation in our laboratory measuring surface profiles on grazing incidence aspheres and also conventional optical surfaces. The LTP characterizes surface height profiles in a non-contact manner over spatial periods ranging from 1 meter (the maximum scan length) to 2 mm (the Nyquist period for 1 mm sampling period) and complements the range of our WYKO NCP-1000 2SX surface roughness profiler (5 mm to 9.8 /un). Usingdoi:10.1117/12.962824 fatcat:q2bghuzhqbbk7mbp5zgpbl77bu