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An attribute np control chart has been designed using resampling systems for monitoring non--conforming items under exponentiated half-logistic distribution. We suppose that lifetime follows exponentiated half-logistic distribution. For the proposed control charts, the optimal parameters and control limits have been obtained. The operational formulas for in-control and out of control average run lengths (ARLs) have been derived. Control constants are established by considering the targetdoi:10.37190/ord200206 fatcat:5iwl7jrkavdtpjwh3mz3ncimmu