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A new on-chip 4-bit transient-to-digital converter for system-level electrostatic discharge (ESD) protection design is proposed. The proposed converter is designed to detect ESD-induced transient disturbances and transfer different ESD voltages into digital codes under system-level ESD tests. The experimental results in a 0.13-µm CMOS integrated circuit with 1.8-V devices have confirmed the detection function and digital output codes. The proposed on-chip transient-to-digital converter can bedoi:10.1109/tie.2011.2157292 fatcat:ucnfspxexbgdrcgqcilvwccvay