Study of the Surface Condition for Surface-Activation Bonding of Si-Si Wafers

Miki INAMURA, Noriko YOSHIDA, Tomohiro ODA, Tomoyuki ABE, Hideyuki ABE, Isao KUSUNOKI
2009 Journal of the Vacuum Society of Japan  
doi:10.3131/jvsj2.52.114 fatcat:4uzcxfviurhxzescrf6dboieom