EuS based thin film layered systems:magnetoresistance and coupling phenomena [article]

Smits, CJP (Coen), Jonge, WJM (Wim) De, Koopmans, B (Bert), Swagten, HJM (Henk)
2006
doi:10.6100/ir609974 fatcat:hwvypborhrb2bmj27cos7m3piq