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Nanoelectronic devices are considered to be the computational fabrics for the emerging nanocomputing systems due to their ultra-high speed and integration density. However, the imperfect bottom-up self-assembly fabrication leads to excessive defects that have become a barrier for achieving reliable computing. In addition, transient errors continue to be a problem. The massive parallelism rendered by nanoscale integration opens up new opportunities but also poses challenges on how to manage suchdoi:10.1145/1482613.1482615 fatcat:ipoydlx7mnb5fjz22dmd4rbmc4