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Strain Mapping with Electron Back Scatter Diffraction: Sensitivity Studies and Pattern Remapping
2013
Microscopy and Microanalysis
Preserved Fulltext
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
doi:10.1017/s1431927613005412
fatcat:2kaybamh2fhl3a3v2zpg6hwoga