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ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 (IEEE Cat. No.04EX753)
This paper summarizes an outline of OAT(Open Architecture Tester), and a positioning of OAT in an LSI manufacturing process is clarified. A mass-production test can be prepared synchronizing with the next SoC generation development & production by the OAT introduction. The panel will be discussed the key issues required in order to make this advantage of the OAT.doi:10.1109/aspdac.2004.1337593 fatcat:b22t552rzbawhf6ik6z7x4f3ku