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X-Ray Diffraction Topographic Observations of the Large-Angle Grain Boundary in Ice Under Deformation
1978
Journal of Glaciology
Large-angle tilt grain boundaries in artificially-grown ice bicrystals were observed by the method of X-ray diffraction topography. In bicrystals for which misorientation angles satisfy the conditions of a high-density coincidence site lattice (CSL) at the boundary, the images of fine parallel line defects appear on the topograph taken immediately after a light deformation. Since these images disappear in a time period between several hours and a few days and reappear again at the same sites
doi:10.3189/s0022143000033748
fatcat:ch2zs3ud3zb43h4d4hdlki6fnu