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Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnosis capability of SBST, in which functional information can be used to guide and facilitate the generation of diagnostic tests. By using a large number of carefully constructed diagnostic test programs, the fault universe can be divided into fine-grained partitions, each corresponding to a unique pass/fail pattern. Wedoi:10.1145/513982.513986 fatcat:tetjfbiznvetbp6zkvxhop74jq